Semiconductor Cassette

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Semiconductor Cassette- Tiv thaiv thiab thauj koj cov wafers nrog precision siv Semicera's Semiconductor Cassette, tsim los ua kom pom kev nyab xeeb thiab ua haujlwm tau zoo hauv qhov chaw tsim khoom siv high-tech.


Product Detail

Khoom cim npe

Semiceraqhia covSemiconductor Cassette, yog ib qho cuab yeej tseem ceeb rau kev ruaj ntseg thiab siv tau zoo ntawm wafers thoob plaws hauv cov txheej txheem tsim khoom semiconductor. Engineered nrog high precision, lub cassette no xyuas kom meej tias koj cov wafers ruaj ntseg khaws cia thiab thauj, tswj lawv kev ncaj ncees ntawm txhua theem.

Superior Protection thiab DurabilityCovSemiconductor Cassettelos ntawm Semicera yog tsim los muab kev tiv thaiv siab tshaj plaws rau koj cov wafers. Tsim los ntawm cov ntaub ntawv muaj zog, tsis muaj paug-tiv taus, nws tiv thaiv koj cov wafers los ntawm kev puas tsuaj thiab kev sib kis, ua rau nws yog qhov kev xaiv zoo tshaj plaws rau qhov chaw huv huv. Lub cassette tus tsim ua kom tsawg kawg nkaus tiam thiab xyuas kom meej tias wafers nyob twj ywm untouched thiab ruaj ntseg thaum tuav thiab tsheb thauj mus los.

Txhim khu kev tsim qauv rau kev ua tau zoo tshaj plawsSemicera covSemiconductor Cassettenta ib qho kev tsim qauv zoo nkauj uas muab cov wafer sib raug zoo, txo qhov kev pheej hmoo ntawm misalignment thiab mechanical puas. Lub cassette lub slots yog zoo kawg nkaus spaced los tuav txhua wafer kom ruaj ntseg, tiv thaiv tej kev txav uas yuav ua rau khawb los yog lwm yam imperfections.

Versatility thiab CompatibilityCovSemiconductor Cassetteyog ntau yam thiab sib xws nrog ntau qhov ntau thiab tsawg wafer, ua rau nws haum rau ntau theem ntawm semiconductor fabrication. Txawm hais tias koj tab tom ua haujlwm nrog tus qauv lossis kev cai wafer qhov ntev, lub cassette no yoog raws li koj xav tau, muab kev yooj yim hauv koj cov txheej txheem tsim khoom.

Streamlined tuav thiab EfficiencyTsim nrog tus neeg siv hauv siab, lubSemicera Semiconductor Cassetteyog lub teeb yuag thiab yooj yim los tuav, tso cai rau kev thauj khoom sai thiab ua haujlwm tau zoo. Qhov no ergonomic tsim tsis tsuas yog txuag lub sijhawm tab sis kuj txo qhov kev pheej hmoo ntawm tib neeg kev ua yuam kev, ua kom muaj kev ua haujlwm zoo hauv koj qhov chaw.

Raws li kev lag luam StandardsSemicera xyuas kom meej tias covSemiconductor Cassetteua tau raws li cov qauv kev lag luam siab tshaj plaws rau kev ua tau zoo thiab kev ntseeg siab. Txhua lub cassette tau dhau qhov kev sim nruj kom lav tias nws ua tau zoo raws li qhov xav tau ntawm kev tsim khoom semiconductor. Qhov kev mob siab rau qhov ua tau zoo ua kom ntseeg tau tias koj cov wafers yeej ib txwm muaj kev tiv thaiv, tswj cov txheej txheem siab uas xav tau hauv kev lag luam.

Cov khoom

Ntau lawm

Kev tshawb fawb

Dummy

Crystal Parameters

Polytype

4H

Deg orientation yuam kev

11-20 > 4 ± 0.15 °

Hluav taws xob Parameters

Dopant

n-hom Nitrogen

Kev tiv thaiv

0.015-0.025ohm · cm

Mechanical Parameters

Txoj kab uas hla

150.0 ± 0.2 hli

Thickness

350 ± 25 hli

Thawj qhov chaw tiaj tiaj

[1-100] ± 5°

Thawj lub tiaj tiaj ntev

47.5 ± 1.5 hli

Secondary flat

Tsis muaj

TTV

≤ 5 hli

≤10 hli

≤ 15 hli

LTV

≤ 3 μm (5mm * 5mm)

≤ 5 μm (5mm * 5mm)

≤ 10 μm (5mm * 5mm)

Hneev

-15μm ~ 15μm

-35μm ~ 35μm

-45μm ~ 45μm

Warp

≤ 35 hli

≤ 45 hli

≤ 55 hli

Pem hauv ntej (Si-face) roughness (AFM)

Ra≤0.2nm (5μm * 5μm)

Qauv

Micropipe ceev

<1 ea/cm2

<10 ea/cm2

<15 ea/cm2

Hlau impurities

≤5E10 atoms/cm2

NA

BPD

≤1500 ea/cm2

≤3000 ea/cm2

NA

TSD

≤500 ea/cm2

≤1000 ea/cm2

NA

Pem hauv ntej zoo

Pem hauv ntej

Si

Nto tiav

Lub ntsej muag CMP

Cov khoom

≤60ea / wafer (qhov loj ≥0.3μm)

NA

Kos

≤5ea / hli Kev sib sau ntev ≤ Diameter

Qhov ntev ≤2 * Txoj kab uas hla

NA

Txiv kab ntxwv tev / pits / stains / striations / tawg / paug

Tsis muaj

NA

Ntug chips / indents / tawg / hex daim hlau

Tsis muaj

Polytype cheeb tsam

Tsis muaj

Thaj tsam ≤ 20%

Thaj tsam ≤ 30%

Pem hauv ntej laser npav

Tsis muaj

Back Quality

Rov qab ua tiav

C-ntsej muag CMP

Kos

≤5ea/mm, Qhov ntev ≤2 * Txoj kab uas hla

NA

Back defects (ntug chips / indents)

Tsis muaj

Rov qab roughness

Ra≤0.2nm (5μm * 5μm)

Rov qab laser npav

1mm (los ntawm sab saum toj ntug)

Ntug

Ntug

Chamfer

Ntim

Ntim

Epi-npaj nrog lub tshuab nqus tsev ntim

Multi-wafer cassette ntim

* Lus Cim: "NA" txhais tau tias tsis muaj kev thov Cov khoom tsis tau hais txog yuav xa mus rau SEMI-STD.

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SiC wafers

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