Silicon Carbide Substrates | SiC Wafers

Lus piav qhia luv luv:

Semicera Energy Technology Co., Ltd. yog ib lub chaw muag khoom tshwj xeeb hauv wafer thiab qib siab semiconductor consumables. Peb tau mob siab rau muab cov khoom zoo, txhim khu kev qha, thiab cov khoom tshiab rau kev tsim khoom semiconductor, kev lag luam photovoltaic thiab lwm yam kev lag luam.

Peb cov khoom lag luam suav nrog SiC / TaC coated graphite cov khoom thiab cov khoom siv ceramic, suav nrog ntau yam ntaub ntawv xws li silicon carbide, silicon nitride, thiab txhuas oxide thiab lwm yam.

Tam sim no, peb tsuas yog cov chaw tsim khoom los muab purity 99.9999% SiC txheej thiab 99.9% recrystallized silicon carbide. Qhov max SiC txheej ntev peb tuaj yeem ua 2640mm.

 

Product Detail

Khoom cim npe

SiC-Wafer

Silicon carbide (SiC) ib qho khoom siv lead ua muaj qhov sib txawv loj (~Si 3 zaug), thermal conductivity (~Si 3.3 npaug lossis GaAs 10 npaug), siab electron saturation migration rate (~Si 2.5 zaug), siab tawg hluav taws xob teb (~ Si 10 zaug lossis GaAs 5 zaug) thiab lwm yam zoo heev.

SiC cov cuab yeej muaj qhov zoo tshaj plaws hauv kev kub siab, kev kub siab, siab zaus, siab zog hluav taws xob cov khoom siv hluav taws xob thiab kev siv ib puag ncig zoo xws li aerospace, tub rog, nuclear zog, thiab lwm yam. kev siv, thiab maj mam dhau los ua lub ntsiab ntawm lub zog semiconductors.

4H-SiC Silicon carbide substrate specifications

Yam khoom 项目

Khoom Specifications

Polytype
晶型

4 H-SiC

6 H-SiC

Txoj kab uas hla
晶圆直径

2 nti | 3 nti | 4 nti | 6 nti

2 nti | 3 nti | 4 nti | 6 nti

Thickness
厚度

330 hli ~ 350 hli

330 hli ~ 350 hli

Kev coj ua
导电类型

N - hom / Semi-insulating
N型导电片/ 半绝缘片

N - hom / Semi-insulating
N型导电片/ 半绝缘片

Dopant
掺杂剂

N2 (Nitrogen)V (Vanadium)

N2 ( Nitrogen ) V ( Vanadium )

Kev taw qhia
晶向

Ntawm axis <0001>
Tawm axis <0001> tawm 4°

Ntawm axis <0001>
Tawm axis <0001> tawm 4°

Kev tiv thaiv
电阻率

0.015 ~ 0.03ohm-cm
(4H-N)

0.02 ~ 0.1 hli
(6 H-N)

Micropipe ntom ntom (MPD)
微管密度

≤10/cm2 ~ ≤1/cm2

≤10/cm2 ~ ≤1/cm2

TTV
总厚度变化

≤ 15 hli

≤ 15 hli

Hnyav / Warp
翘曲度

≤ 25 hli

≤ 25 hli

Nto
表面处理

DSP/SSP

DSP/SSP

Qib
产品等级

Qib / Kev Tshawb Fawb

Qib / Kev Tshawb Fawb

Crystal Stacking Sequence
堆积方式

ABCB

ABCABC

Lattice parameter
晶格参数

ib = 3.076A, c=10.053A

ib = 3.073A, c=15.117A

Eg/eV(Band-gap)
禁带宽度

3, 27 eV

3, 02 eV

ε (Dielectric tsis tu ncua)
介电常数

9.6 ib

9.66 ib

Refraction Index
折射率

n0 = 2.719 ne = 2.777

n0 = 2.707, ne = 2.755

6H-SiC Silicon Carbide substrate specifications

Yam khoom 项目

Khoom Specifications

Polytype
晶型

6 H-SiC

Txoj kab uas hla
晶圆直径

4 nti | 6 nti

Thickness
厚度

350μm ~ 450μm

Kev coj ua
导电类型

N - hom / Semi-insulating
N型导电片/ 半绝缘片

Dopant
掺杂剂

N2 (Nitrogen)
Vanadium (V)

Kev taw qhia
晶向

<0001> tawm 4° ± 0.5°

Kev tiv thaiv
电阻率

0.02 ~ 0.1 hli
(6H-N Hom)

Micropipe ntom ntom (MPD)
微管密度

≤ 10 / cm2

TTV
总厚度变化

≤ 15 hli

Hnyav / Warp
翘曲度

≤ 25 hli

Nto
表面处理

Lub ntsej muag: CMP, Epi-Ready
C Lub ntsej muag: Optical Polish

Qib
产品等级

Qib tshawb fawb

Semicera Chaw Ua Haujlwm Semicera chaw ua haujlwm 2 Cov cuab yeej siv tshuab CNN ua, tshuaj ntxuav, CVD txheej Peb qhov kev pabcuam


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