Silicon carbide (SiC) ib qho khoom siv lead ua muaj qhov sib txawv loj (~Si 3 zaug), thermal conductivity (~Si 3.3 npaug lossis GaAs 10 npaug), siab electron saturation migration rate (~Si 2.5 zaug), siab tawg hluav taws xob teb (~ Si 10 zaug lossis GaAs 5 zaug) thiab lwm yam zoo heev.
SiC cov cuab yeej muaj qhov zoo tshaj plaws hauv kev kub siab, kev kub siab, siab zaus, siab zog hluav taws xob cov khoom siv hluav taws xob thiab kev siv ib puag ncig zoo xws li aerospace, tub rog, nuclear zog, thiab lwm yam. kev siv, thiab maj mam dhau los ua lub ntsiab ntawm lub zog semiconductors.
4H-SiC Silicon carbide substrate specifications
Yam khoom 项目 | Khoom Specifications | |
Polytype | 4 H-SiC | 6 H-SiC |
Txoj kab uas hla | 2 nti | 3 nti | 4 nti | 6 nti | 2 nti | 3 nti | 4 nti | 6 nti |
Thickness | 330 hli ~ 350 hli | 330 hli ~ 350 hli |
Kev coj ua | N - hom / Semi-insulating | N - hom / Semi-insulating |
Dopant | N2 (Nitrogen)V (Vanadium) | N2 ( Nitrogen ) V ( Vanadium ) |
Kev taw qhia | Ntawm axis <0001> | Ntawm axis <0001> |
Kev tiv thaiv | 0.015 ~ 0.03ohm-cm | 0.02 ~ 0.1 hli |
Micropipe ntom ntom (MPD) | ≤10/cm2 ~ ≤1/cm2 | ≤10/cm2 ~ ≤1/cm2 |
TTV | ≤ 15 hli | ≤ 15 hli |
Hnyav / Warp | ≤ 25 hli | ≤ 25 hli |
Nto | DSP/SSP | DSP/SSP |
Qib | Qib / Kev Tshawb Fawb | Qib / Kev Tshawb Fawb |
Crystal Stacking Sequence | ABCB | ABCABC |
Lattice parameter | ib = 3.076A, c=10.053A | ib = 3.073A, c=15.117A |
Eg/eV(Band-gap) | 3, 27 eV | 3, 02 eV |
ε (Dielectric tsis tu ncua) | 9.6 ib | 9.66 ib |
Refraction Index | n0 = 2.719 ne = 2.777 | n0 = 2.707, ne = 2.755 |
6H-SiC Silicon Carbide substrate specifications
Yam khoom 项目 | Khoom Specifications |
Polytype | 6 H-SiC |
Txoj kab uas hla | 4 nti | 6 nti |
Thickness | 350μm ~ 450μm |
Kev coj ua | N - hom / Semi-insulating |
Dopant | N2 (Nitrogen) |
Kev taw qhia | <0001> tawm 4° ± 0.5° |
Kev tiv thaiv | 0.02 ~ 0.1 hli |
Micropipe ntom ntom (MPD) | ≤ 10 / cm2 |
TTV | ≤ 15 hli |
Hnyav / Warp | ≤ 25 hli |
Nto | Lub ntsej muag: CMP, Epi-Ready |
Qib | Qib tshawb fawb |